In-situ Investigation of Grain Rotations during Tensile Straining of Steel Wires

A new indexing procedure based on the direct measurement of the possible grain orientation is presented to characterize single grains within the frame of three-dimensional X-ray diffraction. Depending on the number of reflections considered, the accuracy of grain orientation may be less than 0.1°. The newly developed indexing method was applied to characterize orientation changes of single grains of an austenitic steel specimen, which was in-situ measured during uniaxial tensile deformation.